• 主题
高级搜索  >
历史搜索 清空历史
首页> 外文期刊>Designs, Codes and Crytography >A general check digit system based on finite groups
【24h】

A general check digit system based on finite groups

机译：基于有限群的通用校验码系统

获取原文
获取原文并翻译 | 示例
           
页面导航
  • 摘要
  • 著录项
  • 相似文献
  • 相关主题

摘要

In this paper, we review a new method for the universal design of a check digit system over an abelian group of arbitrary order. Furthermore, we challenge the current standards by comparing this system with several well-known and widely used systems such as ISBN, MEID, ISAN and the system over alphanumeric characters. We show that this novel design outperforms all of them in terms of the error detection capability with a comparable computational complexity. In particular, besides the well-known five types of errors to be detected (i.e., single error and four double errors which are adjacent/jump transposition and adjacent/jump twin errors), we address the -jump transpositions and -jump twin errors which generalize the four types of double errors, and aim to design the check digit system with a detection radius as long as possible that depends on and reflects the capability of detecting these two special kinds of double errors. The results of this paper are based on the results of the article by Chen et al. (On some properties of a check digit system, 2012).
机译：在本文中，我们回顾了一种在任意阶的阿贝尔群上通用设计校验码系统的新方法。此外，我们通过将该系统与几个众所周知的和广泛使用的系统（例如ISBN，MEID，ISAN和带有字母数字字符的系统）进行比较来挑战当前的标准。我们表明，就检错能力而言，这种新颖的设计在所有方面的性能都优于所有其他设计。特别是，除了要检测的五种常见错误（即，单个错误和四个双错误，它们是相邻/跳跃转置和相邻/跳转双胞胎错误）之外，我们还介绍了-jump换位和-jump双胞胎错误，归纳出四种双重错误的类型，旨在设计具有尽可能长的检测半径的校验码系统，该半径取决于并反映了检测这两种特殊的双重错误的能力。本文的结果是基于Chen等人的文章的结果。 （在支票号码系统的某些属性上，2012年）。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱：kefu@zhangqiaokeyan.com

京公网安备：11010802029741号 ICP备案号：京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有

  • 客服微信

  • 服务号