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Surface Tension Measurements with the Drop Profile Analysis Tensiometrya??Consideration of the Surfactant Mass Balance in a Single Drop

机译:用液滴轮廓分析张力法测量表面张力a单液滴中表面活性剂质量平衡的考虑

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In drop profile analysis tensiometry, the ratio of drop surfaces area S to volume V is large, i.e., S/V && 1. In such a case, the concentration of a surfactant within the drop bulk decreases due to adsorption at the drop surface. In contrast, in bubble profile analysis tensiometry, we have S/V && 1 so that depletion due to adsorption is negligible. A protocol is presented to determine the correct adsorption parameters of surfactants from surface tension data measured by bubble and drop profile analysis tensiometry. The procedure is applied to experimental data measured for selected surfactants of different adsorption activities: C10OH, CTAB, Tween 20, and the equimolar mixture SDS + DoTAB. The results show that for surfactants with higher surface activity, the differences between the surface tensions measured with the drops and bubbles profile analysis tensiometry, respectively, are larger, while for less surface-active surfactants, such as SDS, the results obtained from drop and bubble profile experiments are very close. The correction procedure is based on the same set of adsorption parameters used to fit both the experimental data obtained from drop-based measurements (which involve the depletion effects) and those data measured in a way that depletion effects are negligible.
机译:在液滴轮廓分析张力测定法中,液滴表面积S与体积V之比较大,即,S / V> 1。在这种情况下,由于液滴表面的吸附,液滴内部的表面活性剂浓度降低。相反,在气泡轮廓分析张力测定法中,S / V << 0。 1使得由于吸附引起的消耗可以忽略不计。提出了一种协议,该协议可通过气泡和液滴轮廓分析张力法测量的表面张力数据来确定表面活性剂的正确吸附参数。该程序适用于针对不同吸附活性的选定表面活性剂(C10OH,CTAB,吐温20和等摩尔混合物SDS + DoTAB)测得的实验数据。结果表明,对于具有较高表面活性的表面活性剂,分别通过液滴和气泡轮廓分析张力法测量的表面张力之间的差异较大,而对于表面活性较小的表面活性剂(例如SDS),则通过液滴和气泡轮廓实验非常接近。校正程序基于同一组吸附参数,该参数用于拟合从基于液滴的测量(涉及耗尽效应)获得的实验数据和以可忽略的方式测量的那些数据。

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