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Measuring Inner Layer Capacitance with the Colloidal Probe Technique

机译：使用胶体探针技术测量内层电容

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The colloidal probe technique was used to measure the inner layer capacitance of an electrical double layer. In particular, the forces were measured between silica surfaces and sulfate latex surfaces in solutions of monovalent salts of different alkali metals. The force profiles were interpreted with Poisson-Boltzmann theory with charge regulation, whereby the diffuse layer potential and the regulation properties of the interface were obtained. While the diffuse layer potential was measured in this fashion in the past, we are able to extract the regulation properties of the inner layer, in particular, its capacitance. We find systematic trends with the type of alkali metal ion and the salt concentration. The observed trends could be caused by difference in ion hydration, variation of the binding capacitance, and changes of the effective dielectric constant within the Stern layer. Our results are in agreement with recent experiments involving the water-silica interface based on a completely independent method using X-ray photoelectron spectroscopy in a liquid microjet. This agreement confirms the validity of our approach, which further provides a means to probe other types of interfaces than silica.
机译：胶体探针技术用于测量双电层的内层电容。特别地，在不同碱金属的一价盐溶液中在二氧化硅表面和硫酸盐胶乳表面之间测量力。用带电荷调节的泊松-玻尔兹曼（Poisson-Boltzmann）理论解释力分布，从而获得扩散层电势和界面的调节特性。过去以这种方式测量扩散层电势时，我们能够提取内层的调节特性，尤其是其电容。我们发现碱金属离子类型和盐浓度的系统趋势。观察到的趋势可能是由于离子水合作用的不同，结合电容的变化以及斯特恩层内有效介电常数的变化引起的。我们的结果与最近的涉及水-二氧化硅界面的实验相符，该实验基于在液体微喷中使用X射线光电子能谱的完全独立的方法。该协议证实了我们方法的有效性，该方法进一步提供了一种探测二氧化硅以外的其他类型界面的方法。

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