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Design, fabrication and characterization of a high-sensitivity pressure sensor based on nano-polysilicon thin film transistors

机译:基于纳米多晶硅薄膜晶体管的高灵敏度压力传感器的设计,制造与表征

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Based on the nano-polysilicon thin film transistors(TFTs), a high-sensitivity pressuresensor was designed and fabricated in this paper. The pressure sensing element is composed of a Wheatstone bridge with four nano-polysilicon TFTs designed on different positions of the square silicon diaphragm. Via taking the four channel resistors of the TFTs as piezoresistors, the measurement to the external pressure can be realized according to the piezoresistive effects of channel layer. Through adopting complementary metal oxide semiconductor (CMOS) technology and micro-electromechanical system (MEMS) technology, the chips of sensor were fabricated on orientation silicon wafer with a high resistivity. At room temperature, when applying a voltage 5.0 V to the Wheatstone bridge, the full scale (100 kPa) output voltage and the sensitivity of the sensor with 35 μm-thick silicon diaphragm are 267 mV and 2.58 mV/kPa, respectively. The experimental results show that the pressuresensors can achieve a much higher sensitivity.
机译:基于纳米多晶硅薄膜晶体管,设计并制造了一种高灵敏度压力传感器。压力感测元件由惠斯通电桥组成,惠斯通电桥具有四个设计在方形硅膜片不同位置的纳米多晶硅TFT。通过将TFT的四个沟道电阻器作为压阻器,可以根据沟道层的压阻效应来实现对外部压力的测量。通过采用互补金属氧化物半导体(CMOS)技术和微机电系统(MEMS)技术,在具有高电阻率的定向硅片上制备了传感器芯片。在室温下,当向惠斯通电桥施加5.0 V电压时,满刻度(100 kPa)输出电压和具有35μm厚硅膜片的传感器的灵敏度分别为267 mV和2.58 mV / kPa。实验结果表明,压力传感器可以实现更高的灵敏度。

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