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A Novel Subpixel Edge Detection Based on the Zernike Moment

机译:基于Zernike矩的新型亚像素边缘检测

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摘要

A novel sub-pixel edge detection and center localization algorithm for micro-parts is presented for improving the resolution and accuracy of micro-assembly systems. Firstly, the invariant moments are employed to descript the feature of the micro parts, then, we extracts the edge of micro parts at pixel level using canny operator. Secondly, Zernike orthogonal moments is used to relocate the edge of micro size part at sub-pixel level. Last, we apply least squares ellipse fitting to position the center. Experiment results show that the algorithm, we presented could achieve higher location accuracy and consume less time.
机译:提出了一种新型的微零件亚像素边缘检测和中心定位算法,以提高微装配系统的分辨率和精度。首先,利用不变矩来描述微零件的特征,然后,使用Canny算子在像素水平上提取微零件的边缘。其次,使用Zernike正交矩在子像素级上重新定位微尺寸零件的边缘。最后,我们应用最小二乘椭圆拟合来定位中心。实验结果表明,本文提出的算法可以达到较高的定位精度,并且消耗更少的时间。

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