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首页> 外文期刊>SEI Technical Review >Mid-infrared Sensors with InAs/GaSb Superlattice Absorption Layers Grown on InP Substrates
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Mid-infrared Sensors with InAs/GaSb Superlattice Absorption Layers Grown on InP Substrates

机译:InP衬底上生长有InAs / GaSb超晶格吸收层的中红外传感器

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Type-II InAs/GaSb superlattices (SLs), which are attractive for the absorption layers of mid-infrared sensors, are usually grown on GaSb substrates. However, since GaSb substrates absorb infrared light, other substrates with high transparency are favorable for back-illuminated sensors. We have focused on InP substrates with high transparency and relatively small lattice mismatch to GaSb. The crystallographic and optical properties of SLs have been improved as the GaSb buffer layer thickness increases due to the reduction of threading dislocations. We have successfully fabricated sensors with the cutoff wavelength of 6.5 μm using InAs/GaSb SL absorption layers grown on InP substrates for the first time.
机译:通常在GaSb衬底上生长对中红外传感器的吸收层具有吸引力的II型InAs / GaSb超晶格(SL)。但是,由于GaSb衬底吸收红外光,因此其他具有高透明度的衬底对于背照式传感器是有利的。我们专注于InP衬底,该衬底具有高透明度且与GaSb的晶格失配相对较小。随着GaSb缓冲层厚度的增加,由于螺纹位错的减少,SL的晶体学和光学性能得到了改善。我们首次使用在InP衬底上生长的InAs / GaSb SL吸收层成功制造了截止波长为6.5μm的传感器。

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