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首页> 外文期刊>Plasma and Fusion Research >Numerical Simulation of Contactless Methods for Measuring jC in High-Temperature Superconducting Film: Influence of Defect on Resolution and Accuracy
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Numerical Simulation of Contactless Methods for Measuring jC in High-Temperature Superconducting Film: Influence of Defect on Resolution and Accuracy

机译：高温超导薄膜中非接触式测量jC的方法的数值模拟：缺陷对分辨率和精度的影响

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摘要

The inductive method for measuring the critical current density in a high-temperature superconducting (HTS) film has been reproduced numerically. To this end, a numerical code has been developed for analyzing the time evolution of a shielding current density in an HTS film containing a crack. The of computational results show that the accuracy of the inductive method monotonously increases with the height of the coil. In addition, the accuracy is slightly improved by changing the inner radius of the coil, and there exists the optimum inner radius. Although the accuracy is degraded due to the crack, this result means that the inductive method can be applied to the crack detection. Consequently, the crack located near the film edge cannot be detected with high accuracy because the crack is treated the same as the film edge.
机译：在数值上复制了用于测量高温超导（HTS）膜中的临界电流密度的感应方法。为此，已经开发了用于分析包含裂纹的HTS膜中的屏蔽电流密度的时间演变的数字代码。计算结果表明，归纳法的精度随线圈高度的增加而单调增加。另外，通过改变线圈的内半径可以稍微提高精度，并且存在最佳的内半径。尽管由于裂纹而导致精度降低，但是该结果意味着可以将感应方法应用于裂纹检测。因此，由于将裂纹与膜边缘相同地处理，因此不能高精度地检测位于膜边缘附近的裂纹。

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