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首页> 外文期刊>Journal of Materials Science and Chemical Engineering >Analysis of Te and TeO2 on CdZnTe Nuclear Detectors Treated with Hydrogen Bromide and Ammonium-Based Solutions
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Analysis of Te and TeO2 on CdZnTe Nuclear Detectors Treated with Hydrogen Bromide and Ammonium-Based Solutions

机译：溴化氢和铵基溶液处理的CdZnTe核探测器上Te和TeO2的分析

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摘要

Surface defects caused during cutting and polishing in the fabrication of cadmium zinc telluride (CdZnTe) nuclear detectors limit their spectral performance. Chemical treatments are often used to remove surface damages and defects. In this paper, we present the analysis of Te and TeO2 species on the surfaces of CdZnTe nuclear detectors treated with hydrogen bromide and ammonium-based solutions. The CdZnTe wafers were chemo-mechanically polished in a mixture of hydrogen bromide in hydrogen peroxide and ethylene glycol, followed by a chemical passivation in a mixture of ammonium fluoride and hydrogen peroxide solution. X-ray photoelectron spectroscopy showed significant conversion of Te to TeO2, thus producing a more chemically stable surface. The resistivity of the CdZnTe samples is in the order of 1010 ohms-cm. The current for a given applied voltage increased following the passivation and decreased after a 3-hour period. Results from spectral response measurements showed that the 59.5-keV gamma-peak of Am-241 was stable under the same channel for the surface treatment processes.
机译：碲化镉锌（CdZnTe）核探测器制造过程中在切割和抛光过程中造成的表面缺陷限制了它们的光谱性能。化学处理通常用于去除表面损伤和缺陷。在本文中，我们介绍了使用溴化氢和铵基溶液处理的CdZnTe核探测器表面上Te和TeO2种类的分析。在溴化氢在过氧化氢和乙二醇的混合物中化学机械抛光CdZnTe晶片，然后在氟化铵和过氧化氢溶液的混合物中进行化学钝化。 X射线光电子能谱显示Te明显转化为TeO2，从而产生了化学稳定性更高的表面。 CdZnTe样品的电阻率约为1010 ohms-cm。对于给定的施加电压，电流在钝化后增加，在3小时后减小。光谱响应测量的结果表明，Am-241的59.5-keVγ峰在表面处理过程的同一通道下是稳定的。

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