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首页> 外文期刊>Journal of Modern Physics >Self-Sensing and –Actuating Probes for Tapping Mode AFM Measurements of Soft Polymers at a Wide Range of Temperatures
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Self-Sensing and –Actuating Probes for Tapping Mode AFM Measurements of Soft Polymers at a Wide Range of Temperatures

机译:用于在宽温度范围内对柔软聚合物进行攻丝模式AFM测量的自感测和致动探针

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Self-sensing and –actuating probes optimized for conventional tapping mode atomic force microscopy (AFM) are described. 32-kHz quartz tuning forks with a chemically etched and focus ion beam (FIB) sharpened (curvature radii are 5-10 nm) tungsten tip are stable at air and liquid nitrogen atmosphere and at a wide range of temperatures. If driven at constant frequency, the scan speed of such sensors can be up to 3 Hz. AFM was performed on polymer samples in order to study the stability and applicability of these sensor for investigation of soft materials with high dynamical tendencies.
机译:描述了为常规攻丝模式原子力显微镜(AFM)优化的自感应和致动探针。具有化学蚀刻和聚焦离子束(FIB)锐化(曲率半径为5-10 nm)的钨尖的32 kHz石英音叉在空气和液氮气氛中以及在很宽的温度范围内都是稳定的。如果以恒定频率驱动,则此类传感器的扫描速度可高达3 Hz。为了研究这些传感器在研究具有高动态趋势的软材料时的稳定性和适用性,对聚合物样品进行了原子力显微镜研究。

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