Specimen Collection for Electron Microscopy

H. R. Gelderblom; P. R. Hazelton

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Specimen Collection for Electron Microscopy

机译：电子显微镜标本采集

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To the Editor: As virologists whose specialties include diagnostic electron microscopy (EM), we read with interest the discussion on bioterrorism scenarios (1,2) and the subsequent note by Marshall and Catton (3) on the rapid EM diagnostic process used for smallpox (1). EM diagnostics for viral agents offer an open, undirected view; a catch-all method; and speed. A negative stain preparation may be made and a result could be obtained within 5 minutes of the specimen’s arrival in the EM laboratory. As suggested by Marshall and Catton, however, success depends as much on the quality of the sample collected as on the method of preparation and skill of the microscopist.

机译：致编辑：作为专门研究诊断电子显微镜（EM）的病毒学家，我们感兴趣地阅读了有关生物恐怖主义场景的讨论（1,2）以及随后的Marshall和Catton（3）关于用于天花的快速EM诊断过程的说明。（1）。用于病毒制剂的EM诊断提供了开放，无方向的视图;全面的方法;和速度。可以准备负染色剂，并在样品到达EM实验室后的5分钟内获得结果。然而，正如Marshall和Catton所建议的那样，成功与否取决于所采集样品的质量以及显微镜技术人员的制备方法和技能。

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《Emerging Infectious Diseases》 |2000年第4期|共2页
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H. R. Gelderblom; P. R. Hazelton;
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1. An electronic specimen collection protocol schema (eSCPS): Document architecture for specimen management and the exchange of specimen collection protocols between biobanking information systems [J] . EminagaO., SemjonowA., OezguerE., Methods of information in medicine . 2014,第1期

机译：电子标本采集协议方案（eSCPS）：用于标本管理和生物库信息系统之间标本采集协议交换的文档架构
2. Specimen Collection for Electron Microscopy [J] . J. Marshall, M. Catton Emerging Infectious Diseases . 1999,第6期

机译：电子显微镜标本采集
3. Spatial Resolution in Scanning Electron Microscopy and Scanning Transmission Electron Microscopy Without a Specimen Vacuum Chamber [J] . Nguyen Kayla X., Holtz Megan E., Richmond-Decker Justin, Microscopy and microanalysis: The official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada . 2016,第4期

机译：无标本真空室的扫描电子显微镜和透射电子显微镜的空间分辨率
4. Broad ion beam milling of focused ion beam prepared transmission electron microscopy cross-section specimens for high resolution electron microscopy using silicon support membranes [C] . R M Langford, D Ozkaya, B Huey, Royal Microscopical Society Conference, Mar 25-29, 2001, Oxford University . 2001

机译：聚焦离子束制备的透射电子显微镜截面样品的宽离子束铣削，用于使用硅支撑膜的高分辨率电子显微镜
5. Cryo-Electron Microscopy for The Study of Hybrid Materials And Biological Specimens [D] . Spoth, Katherine Anne. 2018

机译：杂交材料和生物标本研究的冷冻电子显微镜
6. Specimen collection for electron microscopy. [O] . H. R. Gelderblom, P. R. Hazelton 2000

机译：用于电子显微镜的标本收集。
7. Specimen collection for electron microscopy. [O] . Gelderblom, H. R., Hazelton, P. R. 2000

机译：用于电子显微镜的标本收集。
8. Preparation of Mica Specimen Support Films for Electron Microscopy and Radiation Damage Induced by High-Energy Electron Bombardment, [R] . spitzer,hermann j. 1971

机译：用于电子显微镜和高能电子轰击引起的辐射损伤的云母标本支持膜的制备，

Specimen Collection for Electron Microscopy

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