• 主题
高级搜索  >
历史搜索 清空历史
首页> 外文期刊>RSC Advances >Silylated oligomeric poly(ether-azomethine)s from monomers containing biphenyl moieties: synthesis and characterization
【24h】

Silylated oligomeric poly(ether-azomethine)s from monomers containing biphenyl moieties: synthesis and characterization

机译：含联苯部分的单体的硅烷化低聚聚（醚-甲亚胺）：合成与表征

获取原文
           
页面导航
  • 摘要
  • 著录项
  • 相似文献
  • 相关主题

摘要

In this study, four new silicon-containing poly(ether-azomethine)s with linear structures were prepared using original silicon and biphenyl moiety-containing monomers: two diamines and two dialdehydes. The oligomeric natures of the samples were established by GPC analysis, which showed chains containing 3 to 5 repetitive units. The monomers and the oligomeric samples were structurally characterized by NMR and FT-IR spectroscopy. The solubilities of the samples in common organic solvents and their thermal behavior enable improvement of their industrial and technological processability. The optical band gaps of the oligomeric samples were estimated from optical measurements (UV-vis), and their electrical behavior in films was determined using the four-point method. The surface arrangements and morphological characteristics of the films were determined via atomic force microscopy measurements. The roughness, area increase percentage and layer stiffness of the films were also measured using this technique.
机译：在这项研究中，使用原始的含硅和联苯部分的单体：两种二胺和两种二醛，制备了四种具有线性结构的新型含硅聚（醚-偶氮甲胺）。样品的低聚性质通过GPC分析确定，该分析显示链包含3至5个重复单元。通过NMR和FT-IR光谱对单体和低聚物样品进行结构表征。样品在普通有机溶剂中的溶解度及其热行为可改善其工业和技术加工性能。通过光学测量（UV-vis）估算低聚物样品的光学带隙，并使用四点法确定其在薄膜中的电性能。通过原子力显微镜测量 确定了薄膜的表面排列和形貌特征。还使用该技术测量了膜的粗糙度，面积增加百分比和层刚度。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱：kefu@zhangqiaokeyan.com

京公网安备：11010802029741号 ICP备案号：京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有

  • 客服微信

  • 服务号