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APS -Annual Meeting of the APS Four Corners Section- Event - Magnetron Sputtering of Arsenic Doped Zinc Oxide Thin Films

机译:APS-anual会议的APS四个角落部分 - 事件 - 砷掺杂氧化锌薄膜的磁控溅射

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Zinc Oxide (ZnO) is a wide band gap semiconductor (3.37 eV) with potential applications in LEDs and military technology. ZnO has native n-type defects, making production of p-type material difficult. In order to form p-type material we have deposited arsenic doped ZnO thin films (extasciitilde 25 microns) by radio frequency magnetron sputtering of a ZnO target onto sapphire substrates coated with evaporated zinc arsenide (ZnAs). Annealing has been employed to improve sample structure. Thin film growth has been refined through characterization by x-ray diffraction techniques, Seebeck effect measurements, and photoluminescence. We will report on the quality of the thin films produced.
机译:氧化锌(ZnO)是一种宽带隙半导体(3.37eV),具有LED和军事技术的潜在应用。 ZnO具有本机N型缺陷,生产P型材料难以。为了形成p型材料,我们已经通过ZnO靶射频磁控溅射沉积砷掺杂的ZnO薄膜(EXTASCIITEDE 25微米),在涂覆有蒸发的锌砷(ZnAs)的蓝宝石底物上。已经采用退火来改善样品结构。通过X射线衍射技术,塞贝克效应测量和光致发光来精制薄膜生长。我们将报告生产的薄膜的质量。

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