Residue-Pole Methods for Variability Analysis of S-parameters of Microwave Devices with 3D FEM and Mesh Deformation

M. R. Rufuie; A. Lamecki; P. Sypek; M. Mrozowski

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Residue-Pole Methods for Variability Analysis of S-parameters of Microwave Devices with 3D FEM and Mesh Deformation

机译：用于3D FEM和网格变形微波器件S参数变化分析的残留杆方法

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This paper presents a new approach for variability analysis of microwave devices with a high dimension of uncertain parameters. The proposed technique is based on modeling an approximation of system by its poles and residues using several modeling methods, including ordinary kriging, Adaptive Polynomial Chaos (APCE), and Support Vector Machine Regression (SVM). The computational cost is compared with the traditional Monte-Carlo method. To improve the efficiency, mesh deformation is applied within 3D FEM framework.

机译：本文提出了一种新方法，可实现具有不确定参数的高尺寸的微波器件的可变性分析方法。所提出的技术基于使用若干建模方法对系统的近似，包括普通的克里格，自适应多项式混沌（APCE）和支持向量机回归（SVM）来建模系统的近似值和残留物。将计算成本与传统的Monte-Carlo方法进行比较。为了提高效率，在3D FEM框架内应用网格变形。

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《Radioengineering》 |2020年第1期|共11页
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M. R. Rufuie; A. Lamecki; P. Sypek; M. Mrozowski;
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1. A Mesh Deformation Technique Based on Solid Mechanics for Parametric Analysis of High-Frequency Devices With 3-D FEM [J] . Adam Lamecki IEEE Transactions on Microwave Theory and Techniques . 2016,第11期

机译：基于固体力学的网格变形技术，用于基于三维有限元的高频设备参数分析
2. Transient 3D heat flow analysis for integrated circuit devices using the transmission line matrix method on a quad tree mesh [J] . T. Smy, D. Walkey, S.K. Dew Solid-State Electronics . 2001,第7期

机译：在四叉树网格上使用传输线矩阵方法对集成电路器件进行瞬态3D热流分析
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机译：使用线法的铁电薄膜平面微波器件的2D和3D分析
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机译：基于结构变形分析的鲁棒网格再生用于电磁设备的3D形状优化
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机译：通过无网格局部Petrov-Galerkin方法分析材料的不连续性，MEMS中的拉入不稳定性，裂纹梁的振动以及橡胶状材料的有限变形。
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机译：基于DEA的设备设计潜在地辅助小腿疾病：分析和有限元分析说明腿部的非线性和设备变形
7. Transient 3D heat flow analysis for integrated circuit devices using the transmission line matrix method on a quad tree mesh [O] . T. Smy, D. Walkey, S. K. Dew 2001

机译：在四叉树网格上使用传输线矩阵方法的集成电路器件的瞬态三维热流分析
8. High Accuracy Microwave S-Parameter Measurements on Solid State Devices. [R] . neidert, r. e. 1979

机译：固态器件的高精度微波s参数测量。

Residue-Pole Methods for Variability Analysis of S-parameters of Microwave Devices with 3D FEM and Mesh Deformation

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