• 主题
高级搜索  >
历史搜索 清空历史
首页> 外文期刊>RSC Advances >Characterization of hydrogenated graphite powder by X-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry
【24h】

Characterization of hydrogenated graphite powder by X-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry

机译：X射线光电子体光谱和飞行时间二次离子质谱法的氢化石墨粉末的表征

获取原文
           
页面导航
  • 摘要
  • 著录项
  • 相似文献
  • 相关主题

摘要

Hydrogenated graphite powder was obtained through Birch reduction of graphite powder and characterized by X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (ToF-SIMS) at 500 °C. The sp ~(3) carbons formed at the edges of the surface of the hydrogenated graphite powder exhibited an sp ~(3) carbon peak in the XPS C1s spectrum. The sp ~(3) -to-sp ~(2) carbon ratio calculated from the XPS spectra increased from 0.08 to 1.19 after hydrogenation. Two sets of peaks, the C _( x ) ~(?) and C _( x ) H ~(?) ion series (where x = 1, 2, 3…), were identified in the ToF-SIMS spectra of both the graphite powder and hydrogenated graphite powder. The difference between these two spectra represented an increase in the normalized intensities of the H ~(?) and C _( x ) H ~(?) ions in the spectrum of the hydrogenated graphite powder, indicating the formation of more sp ~(3) carbons on the surface.
机译：通过石墨粉末的桦木粉末获得氢化石墨粉末，其特征在于X射线光电子谱（XPS）和500℃的飞行时间二次离子质谱（TOF-SIM）。在氢化石墨粉末的表面边缘处形成的SP〜（3）碳在XPS C1S光谱中显示出SP〜（3）碳峰。从XPS光谱计算的SP〜（3）-TO-SP〜（2）碳比从氢化后的0.08增加到1.19。两组峰值，C _（x）〜（？）和c _（x）h〜（x）离子系列（其中x = 1,2,3 ......）被识别在两者的TOF-SIMS光谱中石墨粉和氢化石墨粉末。这两个光谱之间的差异表示在氢化石墨粉末的光谱中H〜（α）和C _（x）H〜（α）离子的归一化强度的增加，表明形成更多SP〜（3 ）表面上的碳。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱：kefu@zhangqiaokeyan.com

京公网安备：11010802029741号 ICP备案号：京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有

  • 客服微信

  • 服务号