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首页> 外文期刊>Analytical Sciences >Sensitive Quantitative Analysis of Strontium in Microdroplet by Surface-enhanced Laser-induced Breakdown Spectroscopy Using Porous Silicon
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Sensitive Quantitative Analysis of Strontium in Microdroplet by Surface-enhanced Laser-induced Breakdown Spectroscopy Using Porous Silicon

机译:用多孔硅通过表面增强激光诱导击穿光谱敏感定量分析微量探测击穿光谱法

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Surface-enhanced laser-induced breakdown spectroscopy (SELIBS) is a promising method for microanalysis of liquid samples. We previously demonstrated that the SELIBS signal was significantly enhanced by using porous silicon (Si) instead of flat Si. In this work, we dried aqueous droplets containing 1 – 200 ppb strontium (Sr) on porous Si substrates and evaluated the quantitative performance by analyzing the dry residues. A linear calibration curve for the Sr quantification (R ~(2) = 0.998) was obtained and an LOD was 0.67 ppb.
机译:表面增强的激光诱导的击穿光谱(SELIB)是液体样品微基分析的有希望的方法。 我们之前证明通过使用多孔硅(Si)而不是扁平Si显着提高Selibs信号。 在这项工作中,我们将含有1-200ppb锶(Sr)的水滴在多孔Si底物上干燥,并通过分析干残留来评价定量性能。 获得Sr定量的线性校准曲线( r〜(2)= 0.998),LOD为0.67ppb。

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