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Phase Transformation by 100 keV Electron Irradiation in Partially Stabilized Zirconia

机译:通过100keV电子照射在部分稳定的氧化锆中的相变

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Partially stabilized zirconia (PSZ) is considered for use as an oxygen-sensor material in liquid lead-bismuth eutectic (LBE) alloys in the radiation environment of an acceleration-driven system (ADS). To predict its lifetime for operating in an ADS, the effects of radiation on the PSZ were clarified in this study. A tetragonal PSZ was irradiated with 100 keV electrons and analyzed by X-ray diffraction (XRD). The results indicate that the phase transition in the PSZ, from the tetragonal to the monoclinic phase, was caused after the irradiation. The deposition energy of the lattice and the deposition energy for the displacement damage of a 100 keV electron in the PSZ are estimated using the particle and heavy ion transport code system and the non-ionizing energy loss, respectively. The results suggest that conventional radiation effects, such as stopping power, are not the main mechanism behind the phase transition. The phase transition is known to be caused by the low-temperature degradation of the PSZ and is attributed to the shift of oxygen ions to oxygen sites. When the electron beam is incident to the material, the kinetic energy deposition and excitation-related processes are caused, and it is suggested to be a factor of the phase transition.
机译:部分稳定的氧化锆(PSZ)被认为用作加速驱动系统(ADS)的辐射环境中的液体铅 - 铋共晶(LBE)合金中的氧传感器材料。为了预测其在广告中运行的寿命,在本研究中阐明了辐射对PSZ的影响。用100keV电子照射四方PSZ并通过X射线衍射(XRD)分析。结果表明,PSZ中的相转变从四边形到单斜相的辐射后是在照射后引起的。使用颗粒和重离子传输代码系统和非电离能量损失估计PSZ中100keV电子的沉积能量和用于位移损伤的沉积能量。结果表明,传统的辐射效应,例如停止功率,不是相位过渡背后的主要机制。已知相转变是由PSZ的低温劣化引起的,并且归因于氧离子的偏移到氧气部位。当电子束入射到材料上时,引起动能沉积和激励相关过程,并且建议是相变的因子。

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