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Estimation of load capacitance and stray inductance in lightning impulse voltage test circuits

机译:估算雷电冲击电压测试电路中的负载电容和杂散电感

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摘要

In order to obtain the lightning impulse voltage waveshape regarding front time, time to half and relative overshoot magnitude within the limits prescribed by IEC 60060-1, it is useful to accurately estimate the test circuit parameters, e.g. load capacitance and circuit inductance. A stray inductance consists of the inductance of impulse generator and the inductance of connecting leads. Load capacitance consists of voltage divider capacitance, test object and parasitic capacitances. In practice, the test object capacitance is often unknown. Capacitance measurement takes time and makes testing procedure more complex. Also, it is very difficult to estimate parasitic capacitances although their influence can sometimes be significant. This paper presents a new genetic algorithm (GA) based method for fast and accurate estimation of load capacitance and circuit inductance during lightning impulse voltage testing of a capacitive load. Computational and experimental verification of the method is successfully performed for standard and non-standard lightning impulse waveforms with various relative overshoot magnitudes.
机译:为了获得在IEC 60060-1规定的限制范围内的有关前置时间,到一半的时间和相对过冲幅度的雷电冲击电压波形,准确估算测试电路参数(例如,负载电容和电路电感。杂散电感由脉冲发生器的电感和连接导线的电感组成。负载电容由分压器电容,测试对象和寄生电容组成。实际上,测试对象的电容通常是未知的。电容测量需要时间,并使测试过程更加复杂。而且,尽管寄生电容的影响有时可能很重要,但很难估计寄生电容。本文提出了一种基于遗传算法的新方法,可以快速,准确地估算电容负载的雷电冲击电压测试期间的负载电容和电路电感。该方法的计算和实验验证已成功地针对具有各种相对过冲幅度的标准和非标准雷电脉冲波形执行。

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