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An Efficient Thermal Model for Multifinger SiGe HBTs Under Real Operating Condition

机译:实际运行条件下的多素SiGe HBT的高效热模型

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摘要

In this work, we present a simple analytical model for electrothermal heating in multifinger bipolar transistors under realistic operating condition where all fingers are heating simultaneously. The proposed model intuitively incorporates the effect of thermal coupling among the neighboring fingers in the framework of self-heating bringing down the overall model complexity. Compared to the traditional thermal modeling approach for an ${n}$ -finger transistor where the number of circuit nodes increases as ${n}^{{2}}$ , our model requires only ${n}$ -number of nodes. The proposed model is scalable for any number of fingers and with different emitter geometries. The model is validated with 3-D thermal simulations and measured data from STMicroelectronics B4T technology. The Verilog-A implemented model simulates 40% faster than the conventional model in a transient simulation of a five-finger transistor.
机译:在这项工作中,我们在逼真的操作条件下呈现了一种用于多叶双极晶体管的电热加热的简单分析模型,在现实的操作状态下,所有手指同时加热。所提出的模型直观地融入了相邻的手指中热耦合在自加热框架中的效果,从而降低了整体模型复杂性。与传统的热建模方法相比<内联公式XMLNS:MML =“http://www.w3.org/1998/math/mathml”xmlns:xlink =“http://www.w3.org/1999/xlink”> $ {n} $ - 电路节点数量的晶体管增加<内联公式XMLNS:MML =“http://www.w3.org/1998/math/mathml”xmlns:xlink =“http://www.w3.org/1999/xlink”> $ {n} ^ {{2}} $ ,我们的模型只需要<内联公式XMLNS:MML =“http://www.w3.org/1998/math/mathml”xmlns:xlink =“http://www.w3.org/1999/xlink”> $ {n} $ - 节点的数量。所提出的模型可用于任何数量的手指和不同的发射器几何形状。该模型用3-D热模拟验证和来自STMicroelectronics B4T技术的测量数据。 Verilog-A实现的模型在五指晶体管的瞬态模拟中模拟比传统模型快40%。

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