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Study of Degradation by Heat and Heat-Resistance Property in Electret Condenser Microphone

机译：驻极体电容传声器的热降解及耐热性能研究

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摘要

This paper describes improvement of the heat resistance of a fixed electrode electret microphone for mobile equipment. First, hypotheses are presented on the cause of the thermal degradation and the corresponding charge behavior in the fixed electrode electret microphone and a model of the internal electric field is formed. The validity of the model is investigated by the thermal stimulated current (TSC) method. Next, the lifetime of the microphone is estimated by reference to the isothermal charge decay test (ICD method) in addition to the hypotheses. As a model, the charges are assumed to be shifted in the direction of greater depth with reduction of the surface potential. This phenomenon is accelerated by heat. The magnitude of the degradation depends on the process used for fabrication of the electret forming film. However, there is sufficient lifetime margin at room temperature. By applying this margin, the environmental characteristic may be improved if the charges are shifted to the interior or injected deeply to avoid the causes of degradation. As an example, for a general-purpose FEP film with a thickness of 12.5 μm, it is estimated that a lifetime of 1000 hours at 100℃ can be guaranteed by deep injection at depths up to about 8 μm from the electret surface.
机译：本文介绍了用于移动设备的固定电极驻极体麦克风的耐热性的改进方法。首先，提出关于热降解的原因和固定电极驻极体传声器中相应电荷行为的假设，并形成内部电场模型。通过热激电流（TSC）方法研究了模型的有效性。接下来，除了假设以外，还通过参考等温电荷衰减测试（ICD方法）来估计麦克风的寿命。作为模型，假定电荷随着表面电势的减小而沿更大的深度方向移动。热会加速这种现象。劣化的程度取决于用于驻极体形成膜的制造过程。但是，在室温下有足够的使用寿命余量。通过应用此裕度，如果电荷转移到内部或深注入以避免降解原因，则可以改善环境特性。例如，对于厚度为12.5μm的通用FEP膜，据估计，通过深注入距驻极体表面约8μm的深度，可以保证在100℃下1000小时的寿命。

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