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Test engineering facing issues of 'brain drain,' talent gap

机译:测试工程面临“脑流失”的问题,人才差距

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摘要

Before joining Evaluation Engineering, I was the editor of two industrial manufacturing trade publications, and one of the most pressing topics among the audience of both was regarding a pending talent gap-a major inevitable problem that manufacturers are going to have, once enough of their baby boomer-era employees retire, and there's not a big-enough young talent pool to replace them. As far as I can tell through my first six months here at EE, electronic test engineering is facing the same major challenge. When veteran test engineers retire, they take decades of test experience and knowledge with them. And unlike 30 years ago-before the need for software and design engineers skyrocketed with Silicon Valley's tech boom-it's substantially harder for test engineering firms to recruit test engineers than it was back then, or even just a decade ago.
机译:在加入评估工程之前,我是两个工业制造业贸易出版物的编辑,两者之间最紧迫的主题之一是待待命人才缺口 - 制造商将拥有的主要不可避免的问题,一旦足够了婴儿潮博客 - 时代员工退休,并没有足够大的年轻人才池来取代它们。据我所知,通过我在EE的前六个月,电子测试工程面临着同样的主要挑战。当资深测试工程师退休时,他们花了几十年的测试经验和与他们的知识。与30年前不同 - 在软件和设计工程中飙升的软件和设计工程师之前,测试工程公司招募测试工程师的测试工程较难,而且甚至在十年前才能升级测试工程师。

著录项

  • 来源
    《Evaluation Engineering》 |2019年第4期|4-4|共1页
  • 作者

    Mike Hockett;

  • 作者单位
  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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