Structural Characterization of Surfaces and Interfaces of Materials by Applying X-ray Total External Reflection Phenomena

Masatoshi Saito; Shigeo Sato; Yoshio Waseda

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Structural Characterization of Surfaces and Interfaces of Materials by Applying X-ray Total External Reflection Phenomena

机译：应用X射线全外反射现象表征材料表面和界面的结构

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An in-house grazing incidence x-ray scattering (GIXS) apparatus has been newly developed for characterizing the surface structure at a microscopic level. Using this apparatus, surface diffraction profiles from the oxidized SUS304 stainless steel were measured in the vicinity of the critical angle with the GIXS geometry. The depth profile was discussed from The integrated intensities of both oxidized phase and Stainless steel bulk. An in-house grazing x-ray Reflection apparatus (GXR0 has also been newly built For studying the liquid surface, and the liquid/sold and Liquid/liquid interfaces.

机译：内部开发了掠入射X射线散射（GIXS）设备，用于在微观水平上表征表面结构。使用该设备，在临界角附近以GIXS几何形状测量了氧化的SUS304不锈钢的表面衍射轮廓。从氧化相和不锈钢块的综合强度讨论了深度分布。还新建了室内放牧X射线反射仪（GXR0），用于研究液面，液/售和液/液界面。

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《High Temperature Materials and Processes》 |1998年第2期|p.117-132|共16页
作者
Masatoshi Saito; Shigeo Sato; Yoshio Waseda;
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正文语种 eng
中图分类金属学与热处理;
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机译：核材料的全反射X射线荧光和能量色散X射线荧光表征
2. Total external reflection of X-rays from solid surfaces [J] . Stozharov V. M. Technical physics . 2017,第1期

机译：来自固体表面的X射线的全部外部反射
3. Summary of ISO/TC 201 Standard: XIX ISO 17331 : 2004 - Surface chemical analysis - Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection x-ray fluores [J] . Mori Y Surface and Interface Analysis: SIA: An International Journal Devoted to the Development and Application of Techniques for the Analysis of Surfaces, Interfaces and Thin Films . 2005,第5期

机译：ISO / TC 201标准摘要：XIX ISO 17331：2004-表面化学分析-从硅晶片工作参考材料表面收集元素的化学方法，并通过全反射X射线荧光剂测定
4. Total internal reflection ellipsometry in the investigation of phenomena at surfaces and interfaces for biosensing [C] . Chlpik J., Bombarova K., Cirak J. International Conference on Advanced Semiconductor Devices and Microsystems . 2014

机译：全内反射椭圆仪用于研究生物传感表面和界面处的现象
5. Applications of total internal reflection fluorescence microscopic technique for studies of chemical phenomena at the substrate-liquid interface. [D] . Phimphivong, Samrane K. 2008

机译：全内反射荧光显微镜技术在底物-液体界面化学现象研究中的应用。
6. A road map to assess critical materials content in boron industrial wastes using sustainable micro-X-ray fluorescence and total reflection X-ray fluorescence instrumentation [O] . İbrahim KULA, Christian GUTSCHE, Yunus ERDOĞAN, 2020

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7. Nanostructural Characterization of Surfaces, Interfaces, and Thinfilms using X-ray Reciprocal-Lattice Space Imaging [O] . Osami SAKATA, Mamoru YOSHIMOTO, Kazushi MIKI, 2007

机译：使用X射线互换晶格空间成像的表面，界面和薄晶体的纳米结构表征
8. Development/Applications of FT-IR ATR (Fourier Transform IR Attenuated Total Internal Reflection) and Photoacoustic Dichroism Techniques for Structural Characterization of Polymer Surfaces [R] . Sung, C. S. 1986

机译：用于聚合物表面结构表征的FT-IR aTR（傅里叶变换红外衰减全内反射）和光声二向色技术的开发/应用

Structural Characterization of Surfaces and Interfaces of Materials by Applying X-ray Total External Reflection Phenomena

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