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Revisiting characteristic impedance and its definition of microstrip line with a self-calibrated 3-D MoM scheme

机译:自校准3-D MoM方案再探微带线的特征阻抗及其定义

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摘要

Characteristic impedance and its definition are revisited and discussed for microstrip line with a self-calibrated three-dimensional (3-D) method of moments (MoM). This 3-D MoM accommodates a scheme called short-open calibration (SOC) so that potential parasitic effects brought by the impressed voltage excitation and other relevant factors can be effectively removed. In this way, the characteristic impedance can be accurately defined through a relationship between equivalent voltage and current on the two sides of a microstrip line having a finite length. Simulated results are compared with the Jansen's two-dimensional (2-D) and Rautio's 3-D definition.
机译:使用自校准的矩量(MoM)三维(3-D)方法,对微带线的特性阻抗及其定义进行了重新讨论。这种3-D MoM采用一种称为短开校准(SOC)的方案,因此可以有效消除施加的电压激励和其他相关因素带来的潜在寄生效应。以这种方式,可以通过具有有限长度的微带线的两侧上的等效电压和电流之间的关系来精确地定义特性阻抗。将模拟结果与Jansen的二维(2-D)和Rautio的3-D定义进行比较。

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