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Total charge capacitor model for short-channel MESFETs

机译:短通道MESFET的总充电电容器模型

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Total charge models for short-channel metal-semiconductor field-effect transistors (MESFETs) currently available in large-signal simulator packages such as SPICE give a poor description of the bias dependence of the gate capacitance. The authors describe a novel empirical model whose structure is deduced from the reconstructed total charge function derived from measured S-parameters. The new model gives a good overall fit to the observed gate capacitance behavior of a commercial monolithic microwave/millimeter-wave integrated circuit (MMIC) MESFET over a wide range of bias conditions and enables large-signal MESFET models to have a superior fit to measured S-parameters, giving greater confidence in design.
机译:当前在诸如SPICE之类的大信号模拟器封装中提供的短沟道金属半导体场效应晶体管(MESFET)的总电荷模型无法很好地描述栅极电容的偏置依赖性。作者描述了一种新颖的经验模型,该模型的结构是从重构的总电荷函数推导而来的,该总电荷函数从测得的S参数得出。新模型对观察到的商用单片微波/毫米波集成电路(MMIC)MESFET在广泛的偏置条件下的栅极电容行为具有良好的总体拟合度,并使大信号MESFET模型对测量的器件具有优异的拟合度S参数,使设计更有信心。

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