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首页> 外文期刊>IEEE Signal Processing Magazine >Deconvolution of atomic force microscopy data for cellular and molecular imaging
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Deconvolution of atomic force microscopy data for cellular and molecular imaging

机译：用于细胞和分子成像的原子力显微镜数据的反卷积

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The restoration of image features in cellular and molecular images is a crucial problem in nanobiological investigations. Scanning probe microscopy (SPM) offers the potential for direct investigative capability at nanometer resolution necessary for imaging biological units and macromolecular protein control blocks. The distortion of the measured image due to tip-sample interaction is a major challenge for nanoscale metrology, and signal processing solutions are needed for increasing the accuracy and reliability of the data. Two candidate approaches have been described in detail in this article for modeling the tip-sample interaction from a topographical perspective, which is then used for reconstructing the sample surface from known tip geometry. When the aspect ratio of a feature is comparable with that of the tip, the two methods produce similar results, but when the aspect ratio is larger than that of the tip, the MM method produces a sharper estimate than the LT method. When the tip geometry is not known, blind-tip estimations methods are needed for iterative estimations of tip and sample surfaces.
机译：细胞和分子图像中图像特征的恢复是纳米生物学研究中的关键问题。扫描探针显微镜（SPM）为以纳米分辨率进行生物分子和大分子蛋白质控制模块成像所必需的直接研究能力提供了潜力。由于尖端-样品相互作用而导致的测量图像失真是纳米计量学的主要挑战，因此需要信号处理解决方案来提高数据的准确性和可靠性。本文已详细描述了两种候选方法，用于从地形角度对针尖样品相互作用进行建模，然后将其用于从已知针尖几何形状重构样品表面。当特征的长宽比与笔尖的长宽比相当时，这两种方法会产生相似的结果，但是当长宽比大于笔尖的长宽比时，MM方法会比LT方法产生更清晰的估计。当尖端几何形状未知时，需要盲尖端估计方法来迭代估计尖端和样品表面。

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