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首页> 外文期刊>IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems >DYNAMITE: an efficient automatic test pattern generation system for path delay faults
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DYNAMITE: an efficient automatic test pattern generation system for path delay faults

机译：DYNAMITE：用于路径延迟故障的高效自动测试码型生成系统

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摘要

The authors present DYNAMITE, a versatile and efficient automatic test pattern generation system for path delay fault. Based upon a ten-valued and a three-valued logic, the deterministic test pattern generation algorithm incorporated in DYNAMITE is capable of generating both robust and nonrobust tests for path delay faults. Particular emphasis has been placed on coping with the main disadvantage of the path delay fault model. The distinct features of DYNAMITE consist of the application of a powerful implication procedure and a stepwise path sensitization procedure, which has the capability of proving large numbers of path faults as redundant by a single test generation attempt. The delay test generation process is further optimized by the use of a new path selection procedure which aims at the identification of paths, which can successfully be sensitized, and the elimination of redundant, i.e., unsensitizable, paths.
机译：作者介绍了DYNAMITE，这是一种用于路径延迟故障的通用，高效的自动测试模式生成系统。基于十值和三值逻辑，DYNAMITE中包含的确定性测试模式生成算法能够生成针对路径延迟故障的鲁棒性和非鲁棒性测试。已经特别强调了应对路径延迟故障模型的主要缺点。 DYNAMITE的独特功能包括应用强大的隐含过程和逐步的路径敏感化过程，该过程具有通过一次测试生成尝试证明大量路径故障为冗余的能力。通过使用新的路径选择程序进一步优化了延迟测试生成过程，该程序旨在识别可以成功地被敏感的路径，并消除冗余的（即不敏感的）路径。

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