首页> 外文期刊>IEEE Transactions on Information Theory >Minimum average cost testing for partially ordered components
【24h】

Minimum average cost testing for partially ordered components

机译:部分订购组件的最低平均成本测试

获取原文
获取原文并翻译 | 示例
           

摘要

The problem of designing a sequence of optimal binary tests for the identification of a single faulty component is addressed. For components in linear order this is equivalent to the classical alphabetic coding problem solved by Hu and Tucker (1971). For partially ordered components the problem is solved by reduction to a minimization over a set of alphabetic problems.
机译:解决了设计用于识别单个故障组件的最佳二进制测试序列的问题。对于线性顺序的分量,这等效于Hu和Tucker(1971)解决的经典字母编码问题。对于部分排序的组件,可通过将一系列字母问题简化为最小化来解决该问题。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号