End domain states and magnetization reversal in submicron magnetic structures

Shi J.; Zhu T.

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End domain states and magnetization reversal in submicron magnetic structures

机译：亚微米磁性结构的端域状态和磁化反转

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Patterned submicron magnetic thin films of various geometries have been systematically studied. We have observed end domain states in rectangular elements, which is in excellent agreement with micromagnetic simulation results. Significant deviation from single domain behavior has been found in low aspect ratio elements. We will show that this deviation is attributed to behavior of the end domains.

机译：已经系统地研究了各种几何形状的图案化亚微米磁性薄膜。我们已经观察到矩形元素中的端域状态，这与微磁仿真结果非常吻合。在低长宽比的元素中发现与单域行为的明显偏差。我们将证明此偏差是由于端域的行为引起的。

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《IEEE Transactions on Magnetics》 |1998年第4期|P.997-999|共3页
作者
Shi J.; Zhu T.;
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中图分类磁性材料、铁氧体;
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End domain states and magnetization reversal in submicron magnetic structures

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