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Co-Zn ferrite rigid disks prepared by plasma-free sputtering at low substrate temperature

机译:在低基板温度下通过无等离子体溅射制备的钴锌铁氧体刚性磁盘

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摘要

Co-Zn ferrite films deposited at substate temperature T/sub c/ below 200/spl deg/C and above 400/spl deg/C by using facing targets sputtering apparatus are composed of crystallites with (111) and (311) orientation, respectively. A maximum 4/spl pi/M/sub s/ of 4.8 kG was obtained at T/sub s/ of 250/spl deg/C and then H/sub c/ was about 1.5 kOe. The linear recording density of 31 kFRPL was obtained and it is the highest value to be reported for ferrite disk media compared to previous studies using a ring type head.
机译:使用面对靶溅射设备在亚态温度T / sub c /下低于200 / spl deg / C和高于400 / spl deg / C沉积的Co-Zn铁氧体膜分别由具有(111)和(311)取向的微晶组成。在T / sub s /为250 / spl deg / C时,获得最大的4.8 kG的4 / spl pi / M / sub s /,然后H / sub c /约为1.5 kOe。获得的线性记录密度为31 kFRPL,与以前使用环形磁头的研究相比,它是铁氧体磁盘介质的最高记录值。

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