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首页> 外文期刊>IEEE Transactions on Magnetics >Anomalous H/sub c/ in CoCr-films: surface and bulk measurements
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Anomalous H/sub c/ in CoCr-films: surface and bulk measurements

机译：CoCr薄膜中的H / sub c /异常：表面和体积测量

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摘要

The major and minor loops of RF sputtered CoCr films in the thickness range of 20-1000 nm and the concentration range of 19-24 at.% Cr were measured by Kerr tracer and VSM. Differences between bulk and surface magnetic data are most likely due to a thickness-dependent surface chemical composition. The maximum anomality of the minor loop coercivity, which depends strongly on the film thickness, appears to be larger at the surface than in the bulk. The anomalous coercivity of the minor loop, which is related to a domain pattern change, could be caused by repulsive forces between domain walls. It can be concluded that study of the minor loop coercivities is an interesting research tool for micromagnetic behavior.
机译：用Kerr示踪仪和VSM测量了厚度为20-1000 nm的Cr的浓度范围为19-24 at。％的RF溅射CoCr膜的主回路和次回路。体磁数据和表面磁数据之间的差异很可能是由于厚度相关的表面化学成分所致。次要环矫顽力的最大异常度，很大程度上取决于薄膜的厚度，在表面比在主体中更大。小畴的异常矫顽力与畴图案的变化有关，可能是畴壁之间的排斥力引起的。可以得出结论，对次环矫顽力的研究是微磁行为的有趣研究工具。

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