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首页> 外文期刊>IEEE Transactions on Magnetics >Evaluation of grain-coupling strength of YBaCuO superconductors by their magnetic-field profile measurements
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Evaluation of grain-coupling strength of YBaCuO superconductors by their magnetic-field profile measurements

机译：通过YBaCuO超导体的磁场分布测量评估其晶粒耦合强度

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摘要

In order to evaluate the strength of intergrain coupling, which determines the transport critical current of polycrystalline oxide superconductors, the relation between the transport critical current and the spatial distribution of the magnetic flux density for YBaCuO thin films as well as bulk superconductors has been studied. The authors have measured the profile of the magnetic flux trapped inside bulk YBaCuO samples with a small Hall magnetic sensor and revealed the correlation between critical-current densities and the slope of the trapped-flux profile, as described by the critical-state model. The measurements of the magnetic-field penetration depth of YBaCuO thin films in a Meissner state is also carried out by measuring the loop inductance of a DC SQUID placed on the YBaCuO thin film to be measured. Observed magnetic-field penetration depths of polycrystalline films with thicknesses of 1-3 mu m deposited on MgO single-crystal substrates amount to approximately 1 mu m for samples with T/sub c/, (end) approximately 80 K and the critical-current density J/sub c/ approximately 10/sup 4/ A/cm/sup 2/ at 4.2 K.
机译：为了评估决定多晶氧化物超导体传输临界电流的晶间耦合强度，研究了YBaCuO薄膜以及体超导体的传输临界电流与磁通密度的空间分布之间的关系。作者用一个小型霍尔磁传感器测量了在大量YBaCuO样品中俘获的磁通量的分布，并揭示了临界电流密度与俘获通量分布的斜率之间的相关性，如临界状态模型所述。迈斯纳状态下的YBaCuO薄膜的磁场穿透深度的测量也通过测量放置在要测量的YBaCuO薄膜上的DC SQUID的环路电感来进行。对于T / sub c /，（终点）约为80 K和临界电流的样品，沉积在MgO单晶衬底上的厚度为1-3μm的多晶膜的观察到的磁场穿透深度约为1μm密度J / sub c /在4.2 K时约为10 / sup 4 / A / cm / sup 2 /

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