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A 2.4-GHz Fully Integrated ESD-Protected Low-Noise Amplifier in 130-nm PD SOI CMOS Technology

机译:采用130nm PD SOI CMOS技术的2.4GHz完全集成ESD保护的低噪声放大器

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摘要

This paper reviews and analyzes a fully integrated electrostatic discharge (ESD)-protected low-noise amplifier (LNA) for low-power and narrowband applications using a cascode inductive source degeneration topology, designed and fabricated in 130-nm CMOS silicon-on-insulator technology. The designed LNA shows 13-dB power gain at 2.4 GHz with a noise figure of 3.6 dB and input return loss of $-$13 dB for power consumption of 6.5 mW. An on-chip “plug-and-play” ESD protection strategy based on diodes and a power clamp is used at the input and output of the LNA, and has an ESD protection level up to 0.8-, 0.9-, and 1.4-A transmission line pulse current. This corresponds to 1.2-, 1.4-, and 2-kV human body model stress applied at, respectively, the RF input, RF output, and $V_{rm DD}$ bus. Measurement shows a minor RF performance degradation by adding the protection diodes.
机译:本文回顾并分析了采用级联电感源负反馈拓扑结构,在130nm CMOS绝缘体上硅芯片上设计和制造的,用于低功率和窄带应用的全集成静电放电(ESD)保护的低噪声放大器(LNA)。技术。设计的LNA在2.4 GHz时显示13 dB的功率增益,噪声系数为3.6 dB,对于6.5 mW的功耗,输入回波损耗为$-$ 13 dB。 LNA的输入和输出使用基于二极管和电源钳位的片上“即插即用” ESD保护策略,其ESD保护级别高达0.8-,0.9-和1.4-A传输线脉冲电流。这对应于分别在RF输入,RF输出和$ V_ {rm DD} $总线上施加的1.2、1.4和2 kV人体模型应力。测量表明,通过添加保护二极管,RF性能会略有下降。

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