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首页> 外文期刊>IEEE transactions on nanotechnology >A Wavelet-Based AFM Fast Imaging Method With Self-Tuning Scanning Frequency
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A Wavelet-Based AFM Fast Imaging Method With Self-Tuning Scanning Frequency

机译：具有自整定扫描频率的基于小波的AFM快速成像方法

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摘要

Due to its numerous advantages, atomic force microscopy (AFM) has been widely utilized in various fields, such as nanotechnology, nanomanipulation, bioscience, etc. However, when considering the increasing requirements from different applications, low scanning speed is one of the most challenging drawbacks which prevents further applications of an AFM system. Based on this observation, this paper proposes a novel wavelet-based AFM fast imaging method with an intelligent adjustment mechanism for scanning frequency over different parts of detected samples, which is especially efficient when scanning biological samples with sparse features. More specifically, a sample is first skipped through quickly with forward scan, during which wavelet analysis is implemented for the collected data to distinguish interesting areas from uninteresting ones, based on which, the sample is then reversely scanned with varying frequencies to obtain trusty information to generate an accurate image for its surface. That is, the proposed fast AFM imaging method carefully scans the identified interesting areas at comparatively low frequency, while skipping through the uninteresting ones quickly with much higher speed, so as to reduce scanning time and simultaneously enhance imaging performance. Performance analysis demonstrates that, due to its unique ability of intelligent tuning for scanning speeds, the designed wavelet-based AFM scanning method maximally increases the imaging speed by ten times. In addition, both simulation and experimental results also verify the good performance of the proposed method. The designed imaging method is finally utilized to scan some biological samples, with collected results further exhibiting its promising prospect.
机译：由于原子力显微镜（AFM）的众多优势，已广泛应用于纳米技术，纳米操作，生物科学等各个领域。但是，考虑到来自不同应用的需求不断增长，低扫描速度是最具挑战性的挑战之一不利于AFM系统进一步应用的缺点。基于这种观察，本文提出了一种新颖的基于小波的原子力显微镜快速成像方法，该方法具有智能调整机制，可对检测到的样品的不同部分进行频率扫描，这在扫描具有稀疏特征的生物样品时特别有效。更具体地说，首先通过正向扫描快速​​跳过一个样本，在此期间，对收集的数据执行小波分析，以区分感兴趣的区域和不感兴趣的区域，然后，以不同的频率对样本进行反向扫描，以获得可信赖的信息。为其表面生成准确的图像。即，所提出的快速AFM成像方法以较低的频率仔细扫描所识别的感兴趣区域，同时以更高的速度快速跳过不感兴趣的区域，从而减少了扫描时间并同时增强了成像性能。性能分析表明，由于其独特的智能调节扫描速度的能力，设计的基于小波的AFM扫描方法最大可将成像速度提高十倍。此外，仿真和实验结果也证明了该方法的良好性能。设计的成像方法最终被用于扫描一些生物样品，收集的结果进一步显示出其有希望的前景。

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