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首页> 外文期刊>IEEE Transactions on Nuclear Science >Radiation and Fault Injection Testing of a Fine-Grained Error Detection Technique for FPGAs
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Radiation and Fault Injection Testing of a Fine-Grained Error Detection Technique for FPGAs

机译:FPGA细粒度错误检测技术的辐射和故障注入测试

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摘要

We present the experimental evaluation of a fine-grained hardening approach that exploits underused and abundant resources found in state-of-the-art SRAM-based FPGAs to detect radiation-induced errors on configuration memories. The technique's main goal is to provide the benefits of fine-grained redundancy, namely improved diagnosis and reduced error latency, with a reduced area overhead. Neutron experiments, validated with fault injection campaigns, demonstrate the proposed technique's efficiency when compared to the traditional dual modular redundancy.
机译:我们提供了一种细粒度强化方法的实验评估,该方法利用了基于SRAM的最新FPGA中未充分利用的丰富资源,以检测配置存储器中的辐射引起的错误。该技术的主要目标是提供细粒度冗余的好处,即改进的诊断和减少的错误等待时间,并减少区域开销。通过故障注入活动进行验证的中子实验证明了与传统的双模块冗余相比,该技术的效率。

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