Combined k-out-of-n:G, and consecutive kc-out-of-n:G systems

Gera A.E.

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Combined k-out-of-n:G, and consecutive kc-out-of-n:G systems

机译：组合的n：G和连续的kc：n系统

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摘要

Qualification tests for a system are normally carried out according to either a k-out-of-n:G scheme, or a consecutive kc-out-of-n:G structure. The reliability of a combination of the two systems is evaluated, showing its benefit over each of the individual structures. As expected, the mean time to failure of the combined system is larger than any of them. Generalizations of the analysis are presented for tests with multi-state results, and for dependent tests. Illustrative numerical results are presented to substantiate the theory.

机译：通常根据k-out-n：G方案或连续的kc-out-n：G结构进行系统的资格测试。评估了这两种系统组合的可靠性，显示了其相对于每个单独结构的优势。不出所料，组合系统的平均故障时间比任何一个都要长。针对具有多状态结果的测试以及相关测试，提供了分析的概括。给出了说明性的数值结果以证实该理论。

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来源
《IEEE Transactions on Reliability》 |2004年第4期|p.523-531|共9页
作者
Gera A.E.;
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收录信息美国《科学引文索引》(SCI);美国《工程索引》(EI);
原文格式 PDF
正文语种 eng
中图分类一般性问题;无线电电子学、电信技术;
关键词
consecutive system reliability; failure analysis; degradation; dependent test; generalization analysis; k-out-of-n:G system reliability; mean time to failure; multistate result; qualification test; two system reliability; consecutive kc-out-of-n:G syste;

机译：连续系统可靠性;故障分析;退化;依赖测试;一般化分析;k-out-n：G系统可靠性;平均失效时间;多状态结果;合格测试;两个系统可靠性;连续kc-out-n ：G系统;

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Combined k-out-of-n:G, and consecutive kc-out-of-n:G systems

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