Reliability sampling plans for lognormal distribution, based onprogressively-censored samples

Balasooriya U.; Balakrishnan N.

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Reliability sampling plans for lognormal distribution, based onprogressively-censored samples

机译：对数正态分布的可靠性抽样计划，基于逐步删减的样本

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This paper presents reliability sampling plans for the lognormalndistribution based on progressively censored samples. In constructingnthese sampling plans, large-sample approximations to the best linearnunbiased estimators of the location and scale parameters are used. Fornsome selected progressive censoring schemes, reliability sampling plansnare tabulated for pΑ and pΒ to matchnMIL-STD-105. While in general, variable-sampling plans require smallernsample size when compared with attribute-sampling plans, the ordinaryncomplete and right-censored life test experiments are special cases ofnthe progressively censored experiment. Hence, the progressively censorednreliability sampling plans in this paper are widely applicable. Generalnapplication of the procedure is discussed, and two examples are provided

机译：本文提出了基于逐步删失样本的对数正态分布的可靠性抽样计划。在构建这些采样计划时，使用了对位置和比例参数的最佳线性无偏估计量的大样本近似值。对于某些选择的渐进式审查方案，可靠性抽样计划的表格列出了pA和pna，以匹配nIL-STD-105。通常，与属性抽样计划相比，可变抽样计划需要较小的样本数量，而普通完全抽样和右审查寿命测试实验是逐步审查实验的特殊情况。因此，本文中的渐进式检验可靠性抽样方案具有广泛的适用性。讨论了该程序的一般应用，并提供了两个示例

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《IEEE Transactions on Reliability》 |2000年第2期|p.199-203|共5页
作者
Balasooriya U.; Balakrishnan N.;
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收录信息美国《科学引文索引》(SCI);美国《工程索引》(EI);
原文格式 PDF
正文语种 eng
中图分类一般性问题;无线电电子学、电信技术;
关键词
life testing; log normal distribution; reliability; sampling methods; Α-normal distribution; MIL-STD-105; acceptance sampling; approximate moment of order statistic; best linear unbiased estimation; best linear unbiased estimators; large-sample approximation;

机译：寿命测试;对数正态分布;可靠性;采样方法;A正态分布;MIL-STD-105;验收采样;近似阶次统计量;最佳线性无偏估计;最佳线性无偏估计器;大样本近似;

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1. Reliability sampling plans for lognormal distribution, based on progressively-censored samples [J] . Balasooriya U., Balakrishnan N. IEEE Transactions on Reliability . 2000,第2期

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2. Reliability sampling plans for a lognormal distribution under progressive first-failure censoring with cost constraint [J] . Singh Sukhdev, Tripathi Yogesh Mani Statistical papers . 2015,第3期

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3. Selection of Sampling Inspection Plans for Life Tests Based on Lognormal Distribution [J] . R. Vijayaraghavan, S. Uma Journal of testing and evaluation . 2016,第5期

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Reliability sampling plans for lognormal distribution, based onprogressively-censored samples

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