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首页> 外文期刊>IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control >Frequency shift of a crystal quartz resonator in thickness-shear modes induced by an array of hemispherical material units
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Frequency shift of a crystal quartz resonator in thickness-shear modes induced by an array of hemispherical material units

机译：由半球形材料单元阵列引起的厚度剪切模式下的石英晶体谐振器的频移

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摘要

A two-dimensional model was established to study the dynamic characteristics of a quartz crystal resonator with the upper surface covered by an array of hemispherical material units. A frequency-dependent equivalent mass ratio was proposed to simulate the effect of the covered units on frequency shift of the resonator system. It was found that the equivalent mass ratio alternately becomes positive or negative with change of shear modulus and radius of each material unit, which indicates that the equivalent mass ratio is strongly related to the vibration mode of the covered loadings. The further numerical results show the cyclical feature in the relationship of frequency shift and shear modulus/radius as expected. The solutions are useful in the analysis of frequency stability of quartz resonators and acoustic wave sensors.
机译：建立了二维模型，以研究其上表面被一系列半球形材料单元覆盖的石英晶体谐振器的动态特性。提出了频率相关的等效质量比，以模拟覆盖的单元对谐振器系统的频移的影响。发现当量质量比随着每个材料单元的剪切模量和半径的变化而交替地变为正或负，这表明当量质量比与所覆盖载荷的振动模式密切相关。进一步的数值结果表明，频移与剪切模量/半径之间的关系具有预期的周期性。该解决方案可用于分析石英谐振器和声波传感器的频率稳定性。

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