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首页> 外文期刊>IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control >Measurement of static and vibration-induced phase noise in UHF thin-film resonator (TFR) filters
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Measurement of static and vibration-induced phase noise in UHF thin-film resonator (TFR) filters

机译：UHF薄膜谐振器（TFR）滤波器中静态和振动引起的相位噪声的测量

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Measurements of the static phase noise and vibration sensitivity of thin-film resonator (TFR) filters operating at 640 and 2110 MHz have been made. They show that the short-term frequency instability of the filters is small compared with that induced in the oscillator signal by the sustaining stage amplifier PM (phase modulation) noise. In-oscillator measurement of filter performance under vibration indicates that fractional frequency vibration sensitivities (/spl delta/f/sub 0//f/sub 0/) are on the order of several parts in 10/sup -9//g. Because the percentage bandwidth and order (number of poles) of the filters was fairly constant, so was the product of the center frequency and group delay. Thus, the fractional frequency vibration sensitivity of the filters can be expressed alternatively as carrier signal phase sensitivity to vibration. The /spl tau/-/spl omega//sub 0/ product for the filters that were tested was on the order of 300 rad, so that the equivalent phase sensitivity to vibration was approximately 1 grad/g.
机译：测量了在640和2110 MHz下工作的薄膜谐振器（TFR）滤波器的静态相位噪声和振动灵敏度。他们表明，与维持级放大器PM（相位调制）噪声在振荡器信号中引起的相比，滤波器的短期频率不稳定性小。振荡器在振动条件下的振荡器内测量表明，分数频率振动灵敏度（/ spl delta / f / sub 0 // f / sub 0 /）大约为10 / sup -9 // g的几个部分。因为滤波器的带宽百分比和阶数（极数）相当恒定，所以中心频率和群延迟的乘积也是如此。因此，滤波器的分数频率振动灵敏度可以替代地表示为载波信号对振动的相位灵敏度。用于测试的过滤器的/ spl tau /-/ spl omega // sub 0 /产品约为300 rad，因此对振动的等效相位灵敏度约为1 grad / g。

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