Longitudinal critical angle singularities and their effect on V(Z)of the line-focus-beam acoustic microscope

Tsukahara Y.; Yongshen Liu; Neron C.; Jen C.K.; Kushibiki J.

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Longitudinal critical angle singularities and their effect on V(Z)of the line-focus-beam acoustic microscope

机译：线聚焦束声学显微镜的纵向临界角奇异性及其对V（Z）的影响

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In order to investigate a mechanism which causes a velocityndifference between the longitudinal wave and leaky surface skimmingncompressional wave (LSSCW) observed in a line-focus-beam acousticnmicroscope, the analytic property of an acoustic reflection coefficientnand its effect on a V(z) analysis were studied. A pole hidden in thenunphysical Riemann sheet close to the longitudinal branch point is foundnto be responsible for the abrupt phase change at the longitudinalncritical angle. This, together with an effect of a dominant Rayleighnwave pole, affects the V(z) measurement of the LSSCW. A method tonestimate the longitudinal and shear wave velocities is discussed

机译：为了研究在线聚焦束声学显微镜中观察到的纵向波与泄漏表面撇除压缩波（LSSCW）之间的速度差的机制，对声反射系数n的解析性质及其对V（z）分析的影响进行了研究。研究。发现一个隐藏在靠近纵向分支点的非物理Riemann片中的极点是造成纵向临界角处突然相变的原因。这与主要瑞利波极的影响一起，会影响LSSCW的V（z）测量。讨论了一种改善纵向波和切变波速度的方法

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来源
《IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control》 |1994年第4期|p.458-466|共9页
作者
Tsukahara Y.; Yongshen Liu; Neron C.; Jen C.K.; Kushibiki J.;
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正文语种 eng
中图分类声学工程;计量学;
关键词
acoustic microscopy; focusing; ultrasonic reflection; abrupt phase change; acoustic reflection coefficient; dominant Rayleigh wave pole; leaky surface skimming compressional wave; line-focus-beam acoustic microscope; longitudinal branch point; longitudinal critic;

机译：声显微镜;聚焦;超声反射;突变相变;声反射系数;显性瑞利波极;泄漏表面掠读压缩波;线聚焦束声显微镜;纵向分支点;纵向注释;

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Longitudinal critical angle singularities and their effect on V(Z)of the line-focus-beam acoustic microscope

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