SiGe tests the best

Roy Szweda

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SiGe tests the best

机译：SiGe测试最好

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Researchers have often been able to set records with SiGe-based circuits. Today such SiGe devices have taken over what used to be a key role for Ⅲ-Ⅴs - measuring the fastest production chips. Recently, Tektronix launched the world's fastest, most capable real-time oscilloscope range to test 2nd-generation serial data standards such as 2G PCI-Express, SATAIII and double XAUI. New members of the TDS6000 family of digital storage oscilloscopes (DSO) include the record-breaking 15 GHz TDS6154C. This DSO can cope with the most demanding high-speed applications thanks to its SiGe Z-active probing architecture P7313 probe accessory.

机译：研究人员通常能够使用基于SiGe的电路来设置记录。如今，此类SiGe器件已经取代了Ⅲ-Ⅴ族的关键角色-测量最快的生产芯片。最近，泰克推出了世界上最快，功能最强大的实时示波器系列，以测试第二代串行数据标准，例如2G PCI-Express，SATAIII和双XAUI。 TDS6000数字存储示波器（DSO）系列的新成员包括创纪录的15 GHz TDS6154C。凭借其SiGe Z有源探测架构P7313探头附件，该DSO可以应付最苛刻的高速应用。

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《III-Vs Review》 |2005年第2期|p.55|共1页
作者
Roy Szweda;
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中图分类无线电电子学、电信技术;
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SiGe tests the best

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