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首页> 外文期刊>IEEE Transactions on Industrial Electronics >A Multimode Transverse Dynamic Force Microscope—Design, Identification, and Control
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A Multimode Transverse Dynamic Force Microscope—Design, Identification, and Control

机译:多模横向动态力显微镜 - 设计,识别和控制

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摘要

The transverse dynamic force microscope (TDFM) and its shear force sensing principle permit true noncontact force detection in contrast to typical atomic force microscopes. The two TDFM measurement signals for the cantilever allow, in principle, two different scanning modes of which, in particular, the second presented here permits a full-scale noncontact scan. Previous research work mainly focused on developing the sensing mechanism, whereas this paper investigates the vertical axis dynamics for advanced robust closed-loop control. This paper presents a new TDFM digital control solution, built on field-programmable gate array equipment running at high implementation frequencies. The integrated control system allows the implementation of online customizable controllers, and raster scans in two modes at very high detection bandwidth and nanoprecision. Robust control algorithms are designed, implemented, and practically assessed. The two realized scanning modes are experimentally evaluated by imaging nanospheres with known dimensions in wet conditions.
机译:横向动态力显微镜(TDFM)及其剪切力传感原理允许与典型的原子力显微镜相比,真正的非接触力检测。用于悬臂的两个TDFM测量信号原则上允许两种不同的扫描模式,特别是其这里呈现的第二种扫描模式允许满量程的非接触扫描。以前的研究工作主要集中在开发传感机制上,而本文调查了先进的稳健闭环控制的垂直轴动态。本文提出了一种新的TDFM数字控制解决方案,内置于高实现频率下运行的现场可编程门阵列设备。集成控制系统允许在非常高的检测带宽和纳频度下实现在线可定制的控制器和光栅扫描。设计,实现和实际评估强大的控制算法。通过在潮湿条件下成像纳米尺寸的成像纳米体进行实验评估两种实现的扫描模式。

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