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Multifingers Capacitances Modeling of 65-Nm CMOS Transistor by Unit Cell Method

机译:基于单元法的65 Nm CMOS晶体管多指电容建模

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摘要

The multifingers' parasitic capacitances modeling of 65-nm CMOS transistors for millimeter-wave application is presented. The modeling is based on simulation approach, which is done by building the devices true dimension in high-frequency structure simulator environment. The material properties of the devices as given by the foundry are used dur-ing simulation and then full electromagnetic simulations are carried out to extract the Y-pa-rameters of the model. Unit-cell parameters extraction method is carried out in order to save memory and simulation time. In this case, the multifinger transistors are divided into unit-cells and then the parasitic capacitances of the unit-cells are calculated from the extracted Y-parameter. Based on linear scaling, the parasitic capacitance of the multifingers transistor can be obtained with good accuracy (less than 5% error).
机译:提出了毫米波应用的65 nm CMOS晶体管的多指寄生电容模型。建模基于仿真方法,通过在高频结构仿真器环境中构建设备的真实尺寸来完成。在仿真过程中使用了铸造厂给出的设备的材料特性,然后进行了完整的电磁仿真,以提取模型的Y参数。为了节省内存和仿真时间,执行了单元参数提取方法。在这种情况下,将多指晶体管划分为单位单元,然后根据提取的Y参数来计算单位单元的寄生电容。基于线性缩放,可以以良好的精度(小于5%的误差)获得多指晶体管的寄生电容。

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