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首页> 外文期刊>Japanese journal of applied physics >Measurement of Refractive Index, Specific Heat Capacity, and Thermal Conductivity for Ag_(6.0)ln_(4.5)Sb_(60.8)Te_(28.7) at High Temperature
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Measurement of Refractive Index, Specific Heat Capacity, and Thermal Conductivity for Ag_(6.0)ln_(4.5)Sb_(60.8)Te_(28.7) at High Temperature

机译:Ag_(6.0)ln_(4.5)Sb_(60.8)Te_(28.7)的高温折射率,比热容和导热系数的测量

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摘要

We have measured the temperature dependence of refractive index, thermal conductivity (K) and specific heat capacity (C) for Ag_(6.0)ln_(4.5)Sb_(60.8)Te_(28.7) (AIST). For measurement of refractive index, a spectroscopic ellipsometry was employed over a wavelength range from 300 to 1700nm whilst the temperature was increased from room temperature to 450 ℃. For measurement of K, we used a novel instrument called "a nanosecond thermoreflectance measurement system" developed by Baba et al. Using this system, it is possible to easily obtain the K of thin film samples which range in thickness from sub-micron down to 100nm. We measured the Ks up to 400 ℃; a clear temperature dependence was observed whereby Ks increased with increasing temperature. For measurement of C, we used a differential scanning calorimeter. The C of AIST also increase before the melting point (530 ℃); after melting the C rapidly decreased with increasing temperature.
机译:我们测量了Ag_(6.0)ln_(4.5)Sb_(60.8)Te_(28.7)(AIST)的折射率,导热率(K)和比热容(C)的温度依赖性。为了测量折射率,在从300到1700nm的温度范围内,同时将温度从室温升高到450℃,采用椭圆偏振光谱法。对于K的测量,我们使用了由Baba等人开发的新型仪器,称为“纳秒热反射率测量系统”。使用此系统,可以轻松获得K薄膜样品,其厚度范围从亚微米到100nm。我们测量了高达400℃的Ks。观察到明显的温度依赖性,由此Ks随温度升高而增加。为了测量C,我们使用了差示扫描量热仪。 AIST的C也在熔点(530℃)之前升高;熔化后,碳随温度升高而迅速降低。

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  • 来源
    《Japanese journal of applied physics》 |2009年第5issue3期|05EC02.1-05EC02.3|共3页
  • 作者单位

    Center for Applied Near-field Optics Research (CAN-FOR), AIST, Central 4, 1-1-1 Higashi, Tsukuba, Ibaraki 305-8562, Japan;

    Center for Applied Near-field Optics Research (CAN-FOR), AIST, Central 4, 1-1-1 Higashi, Tsukuba, Ibaraki 305-8562, Japan;

    J. A. Woollam Japan Co., Fuji Building 2F, 5-22-9 Ogikubo, Suginami-ku, Tokyo 167-0051, Japan;

    National Metrology Institute of Japan (NMIJ), AIST, Central 3, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8563, Japan;

    National Metrology Institute of Japan (NMIJ), AIST, Central 3, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8563, Japan;

    National Metrology Institute of Japan (NMIJ), AIST, Central 3, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8563, Japan;

    Center for Applied Near-field Optics Research (CAN-FOR), AIST, Central 4, 1-1-1 Higashi, Tsukuba, Ibaraki 305-8562, Japan;

    J. A. Woollam Japan Co., Fuji Building 2F, 5-22-9 Ogikubo, Suginami-ku, Tokyo 167-0051, Japan;

    Center for Applied Near-field Optics Research (CAN-FOR), AIST, Central 4, 1-1-1 Higashi, Tsukuba, Ibaraki 305-8562, Japan;

    National Metrology Institute of Japan (NMIJ), AIST, Central 3, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8563, Japan;

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