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首页> 外文期刊>Japanese journal of applied physics >Cross-sectional Transmission Electron Microscopy and Optical Characterization of Gold Nanoislands
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Cross-sectional Transmission Electron Microscopy and Optical Characterization of Gold Nanoislands

机译：金纳米岛的截面透射电子显微镜和光学表征

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摘要

In this paper, we present the cross-sectional transmission electron microscope images of gold nanoislands formed by annealing ultrathin gold films to correctly determine the nanoisland three-dimensional shapes. The samples studied were 5 and 7 nm gold films deposited on quartz and annealed at 500 and 900℃. The cross-sectional view of the gold nanoislands confirmed that they appear to be like truncated spheres and not like the usually assumed spheroids. The shape of the nanoislands varied from spherical to hemispherical under different sample fabrication conditions. These shapes are consistent with the results predicted by polarized absorption spectroscopy.
机译：在本文中，我们介绍了通过对超薄金膜进行退火以正确确定纳米岛三维形状而形成的纳米金横截面的透射电子显微镜图像。研究的样品是沉积在石英上并在500和900℃退火的5和7 nm金膜。金纳米岛的横截面图证实，它们看起来像是截断的球体，而不像通常假定的球体。在不同的样品制造条件下，纳米岛的形状从球形到半球形不等。这些形状与偏振吸收光谱法预测的结果一致。

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  • 来源
    《Japanese journal of applied physics》 |2009年第8issue1期|080207.1-080207.2|共2页
  • 作者

    Gaurav Gupta; Yoshiko Nakayama; Kazuo Furuya; Kazutaka Mitsuishi; Masayuki Shimojo; Kotaro Kajikawa;

  • 作者单位

    Interdisciplinary Graduate School of Science and Engineering, Tokyo Institute of Technology, Yokohama 226-8502, Japan;

    High Voltage Electron Microscopy Station, National Institute for Materials Science, Tsukuba, Ibaraki 305-0003, Japan;

    High Voltage Electron Microscopy Station, National Institute for Materials Science, Tsukuba, Ibaraki 305-0003, Japan;

    High Voltage Electron Microscopy Station, National Institute for Materials Science, Tsukuba, Ibaraki 305-0003, Japan;

    High Voltage Electron Microscopy Station, National Institute for Materials Science, Tsukuba, Ibaraki 305-0003, Japan Advanced Science Research Laboratory, Saitama Institute of Technology, Fukaya, Saitama 369-0293, Japan;

    Interdisciplinary Graduate School of Science and Engineering, Tokyo Institute of Technology, Yokohama 226-8502, Japan;

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