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首页> 外文期刊>Japanese journal of applied physics >Geometric Characterization of Carbon Nanotubes by Atomic Force Microscopy in Conjunction with a Tip Characterizer
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Geometric Characterization of Carbon Nanotubes by Atomic Force Microscopy in Conjunction with a Tip Characterizer

机译：碳纳米管的几何表征通过原子力显微镜与尖端表征器相结合

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摘要

An atomic force microscopy (AFM) probe tip characterizer with 14 line and space structures and two knife edges was fabricated by means of a superlattice technique. The shape of a probe tip both before and after AFM imaging was acquired by this tip characterizer with general variations < 1.5 nm; depending on imaging conditions. The geometric structures of carbon nanotubes (CNTs) on a SiO_2 substrate were studied by dynamic mode AFM in conjunction with this tip characterizer. Contact points between the tip and the CNTs were detected by observing changes in the AFM phase images. A modified CNT width correction model was established to calculate the estimated and upper-limit widths of two CNTs. The experimental results showed that imaging under a weak attractive force was suitable for obtaining accurate CNT height measurements, whereas a weak repulsive force provided the most accurate widths. Differing heights and widths between the two CNTs suggested that one CNT was double-walled, whereas the other had more than two walls; these results agree with transmission electron microscopy (TEM) measurements of the CNTs.
机译：利用超晶格技术制造了具有14条线和空间结构以及两个刀刃的原子力显微镜（AFM）探针头表征器。该探头特征分析仪可在AFM成像之前和之后获取探头尖端的形状，其总体变化<1.5 nm；取决于成像条件。通过动态模式原子力显微镜（AFM）结合该尖端特性研究了SiO_2衬底上碳纳米管（CNT）的几何结构。通过观察AFM相图像的变化来检测尖端与CNT之间的接触点。建立了改进的CNT宽度校正模型，以计算两个CNT的估计宽度和上限宽度。实验结果表明，在弱吸引力下成像适合获得准确的CNT高度测量值，而弱排斥力则提供最准确的宽度。两种碳纳米管之间的高度和宽度不同，表明一种碳纳米管是双壁的，而另一种碳纳米管则多于两壁。这些结果与CNT的透射电子显微镜（TEM）测量结果一致。

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