首页> 外国专利> Y-SHAPED CARBON NANOTUBES AS AFM PROBE FOR ANALYZING SUBSTRATES WITH ANGLED TOPOGRAPHY, METHOD FOR THEIR MANUFACTURE, METHOD FOR PERFORMING ATOMIC FORCE MICROSCOPY AND METHOD FOR SELECTIVELY MODIFYING THE SURFACE OF A SUBSTRATE USING SAID Y-SHAPED NANOTUBES

Y-SHAPED CARBON NANOTUBES AS AFM PROBE FOR ANALYZING SUBSTRATES WITH ANGLED TOPOGRAPHY, METHOD FOR THEIR MANUFACTURE, METHOD FOR PERFORMING ATOMIC FORCE MICROSCOPY AND METHOD FOR SELECTIVELY MODIFYING THE SURFACE OF A SUBSTRATE USING SAID Y-SHAPED NANOTUBES

机译:Y型碳纳米管作为AFM探针,用于分析成角度的地形图,其制造方法,执行原子力显微镜的方法以及使用所说的Y形纳米管选择性修饰基体表面的方法

摘要

A Y-shaped carbon nanotube atomic force microscope probe tip and methods comprise a shaft portion; a pair of angled arms extending from a same end of the shaft portion, wherein the shaft portion and the pair of angled arms comprise a chemically modified carbon nanotube, and wherein the chemically modified carbon nanotube is modified with any of an amine, carboxyl, fluorine, and metallic component. Preferably, each of the pair of angled arms comprises a length of at least 200 nm and a diameter between 10 and 200 nm. Moreover, the chemically modified carbon nanotube is preferably adapted to allow differentiation between substrate materials to be probed. Additionally, the chemically modified carbon nanotube is preferably adapted to allow fluorine gas to flow through the chemically modified carbon nanotube onto a substrate to be characterized. Furthermore, the chemically modified carbon nanotube is preferably adapted to chemically react with a substrate surface to be characterized.
机译:Y形碳纳米管原子力显微镜探针头和方法从轴部分的同一端延伸的一对成角度的臂,其中轴部分和成对的成对的臂包括化学改性的碳纳米管,并且其中化学改性的碳纳米管被胺,羧基,氟中的任何一种改性以及金属成分。优选地,成对的成角度的臂中的每一个包括至少200nm的长度和在10至200nm之间的直径。此外,化学修饰的碳纳米管优选适于允许在待探测的基底材料之间进行区分。另外,化学改性的碳纳米管优选适于使氟气流过化学改性的碳纳米管到待表征的基材上。此外,化学改性的碳纳米管优选适于与待表征的基材表面化学反应。

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