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首页> 外文期刊>Japanese Journal of Applied Physics. Part 2, Letters & Express Letters >Realization of High-Crystalline-Quality Thick m-Plane GaInN Film on 6H-SiC Substrate by Epitaxial Lateral Overgrowth
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Realization of High-Crystalline-Quality Thick m-Plane GaInN Film on 6H-SiC Substrate by Epitaxial Lateral Overgrowth

机译:外延横向生长在6H-SiC衬底上实现高晶质厚m平面GaInN薄膜的实现

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摘要

A high-crystalline-quality thick m-plane Ga_(0.92)In_(0.08)N film has been realized by epitaxial lateral overgrowth (ELO). The photoluminescence intensity of thick ELO-GaInN is about 6 times stronger than that of conventional thick GalnN. We fabricated a light-emitting diode (LED) having a GaInN/GaN multiquantum wells (MQWs) active layer on an ELO-GaInN layer. Satellite peaks of (1010) in the 2θ/ω-scan X-ray diffraction profile from this LED can be clearly observed, suggesting that MQWs having a sharp interface are grown. This new LED exhibits blue-light emission with a peak wavelength of 450 nm.
机译:通过外延横向过生长(ELO)已经实现了高质量的厚m平面的Ga_(0.92)In_(0.08)N薄膜。厚ELO-GaInN的光致发光强度是常规厚GalnN的6倍。我们制造了在ELO-GaInN层上具有GaInN / GaN多量子阱(MQW)有源层的发光二极管(LED)。可以清楚地观察到来自该LED的2θ/ω扫描X射线衍射图中的(1010)卫星峰,这表明具有清晰界面的MQW得以生长。这种新的LED具有峰值波长为450 nm的蓝光发射。

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