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Silicon Complementary Metal-Oxide-Semiconductor Field-Effect Transistors with Dual Work Function Gate

机译:具有双功函数门的硅互补金属氧化物半导体场效应晶体管

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摘要

This paper discusses silicon complementary metal-oxide-semiconductor (CMOS) field-effect transistors with dual work function gates (DWFG) to improve transconductance (g_m) and drain conductance (g_(ds)) characteristics. For a n-channel metal-oxide-semiconductor field-effect transistor (MOSFET) device, the polycrystalline silicon (poly-Si) gate on the source and drain side are doped p+ and n+, respectively and vice versa for a p-channel MOSFET. The work function difference in a poly-Si gate affects channel potential distribution and increases the lateral electric field inside the channel. The increased electric field inside the channel improves carrier drift velocity. Experimental results from the fabricated DWFG devices show improved g_m and g_(ds) over conventional single work function gate devices.
机译:本文讨论了具有双功函数门(DWFG)的硅互补金属氧化物半导体(CMOS)场效应晶体管,以提高跨导(g_m)和漏极电导(g_(ds))特性。对于n沟道金属氧化物半导体场效应晶体管(MOSFET)器件,源极和漏极侧的多晶硅(poly-Si)栅极分别掺杂p +和n +,反之亦然。 。多晶硅栅极中的功函数差异会影响沟道电势分布并增加沟道内部的横向电场。通道内增加的电场改善了载流子漂移速度。所制造的DWFG器件的实验结果表明,与传统的单功函数门器件相比,g_m和g_(ds)有所提高。

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