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首页> 外文期刊>Japanese Journal of Applied Physics. Part 1, Regular Papers & Short Notes >Correction of Substrate Vertical Birefringence Using Patterned Wave Plate
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Correction of Substrate Vertical Birefringence Using Patterned Wave Plate

机译：利用图案化波片校正衬底垂直双折射

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摘要

In an optical disk system in which an optical head with a polarizing optics is employed and light is focused through a substrate of the disk, the read/write characteristics of the system are degraded by the birefringence of the substrate. A polycarbonate substrate has both an in-plane birefringence and a vertical birefringence. The birefringence of the polycarbonate substrate is measured and its influence is estimated by a numerical calculation. It is understood that the in-plane birefringence simply decreases light intensity at the photodetector, while the vertical birefringence not only decreases light intensity at the photodetector but also increases a focused spot diameter on the disk and decreases the resolution of a radio frequency (RF) signal. A method of correcting the vertical birefringence using a newly developed patterned wave plate is proposed to improve the read/write characteristics of an optical disk system. Increases in the light intensity and resolution using a patterned wave plate are confirmed experimentally.
机译：在采用具有偏振光学器件的光头并且光通过盘的基底聚焦的光盘系统中，系统的读/写特性由于基底的双折射而降低。聚碳酸酯基板具有面内双折射和垂直双折射。测量聚碳酸酯基板的双折射，并通过数值计算来估计其影响。可以理解，面内双折射仅会降低光电检测器处的​​光强度，而垂直双折射不仅会降低光电检测器处的​​光强度，还会增加磁盘上的聚焦光斑直径并降低射频（RF）的分辨率信号。提出了一种使用新开发的图案化波片来校正垂直双折射的方法，以改善光盘系统的读取/写入特性。实验上证实了使用图案化波片提高了光强度和分辨率。

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