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首页> 外文期刊>Japanese journal of applied physics >Insulation resistance degradation mechanisms of multilayer ceramic capacitors during highly accelerated temperature and humidity stress tests
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Insulation resistance degradation mechanisms of multilayer ceramic capacitors during highly accelerated temperature and humidity stress tests

机译：高度加速的温度和湿度应力测试中多层陶瓷电容器的绝缘电阻降低机理

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The failure mechanisms of multilayer ceramic capacitors (MLCCs) with Ni internal electrodes under high temperature and high voltage conditions have been investigated through highly accelerated life tests (HALTs) in recent years. Generally, insulation resistance degradation during HALTs is presumed to be because of the electromigration of oxygen vacancies. Reliability in high-temperature, high-humidity, and rated-voltage environments is important for MLCCs. However, only a few studies have investigated the causes of insulation resistance degradation in MLCCs in these environments. We investigated the failure mechanisms of MLCCs through a highly accelerated temperature and humidity stress test. On the basis of presence of a degraded area on the anode side, we presumed that hydrogen ions were produced by H2O electrolysis at the interface between the ceramics and internal electrodes on the anode side, and that these hydrogen ions caused insulation resistance degradation. (C) 2018 The Japan Society of Applied Physics
机译：近年来，通过高度加速寿命试验（HALT），研究了带有Ni内部电极的多层陶瓷电容器（MLCC）在高温和高压条件下的失效机理。通常，HALTs期间的绝缘电阻下降被认为是由于氧空位的电迁移引起的。对于MLCC，在高温，高湿和额定电压环境中的可靠性很重要。但是，只有很少的研究调查了在这些环境中MLCC中绝缘电阻下降的原因。我们通过高度加速的温度和湿度应力测试研究了MLCC的失效机理。基于阳极侧的劣化区域的存在，我们推测通过H 2 O电解在阳极侧的陶瓷和内部电极之间的界面处产生氢离子，并且这些氢离子导致绝缘电阻降低。 （C）2018日本应用物理学会

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