机译:X射线区域中使用GISAXS的聚合物薄膜的结构分析:使用光子工厂BL-15A2的X射线能量的GISAXS实验的概念和设计
Photon Factory, Institute of Materials Structure Science, High Energy Accelerator Research Organization, 1-1 Oho, Tsukuba, Ibaraki 305-0801, Japan;
Photon Factory, Institute of Materials Structure Science, High Energy Accelerator Research Organization, 1-1 Oho, Tsukuba, Ibaraki 305-0801, Japan;
Photon Factory, Institute of Materials Structure Science, High Energy Accelerator Research Organization, 1-1 Oho, Tsukuba, Ibaraki 305-0801, Japan;
Photon Factory, Institute of Materials Structure Science, High Energy Accelerator Research Organization, 1-1 Oho, Tsukuba, Ibaraki 305-0801, Japan;
Photon Factory, Institute of Materials Structure Science, High Energy Accelerator Research Organization, 1-1 Oho, Tsukuba, Ibaraki 305-0801, Japan;
Mitsubishi Electric System & Service Co., Ltd, Accelerator Engineering Center, 2-8- 8 Umezono, Tsukuba, Ibaraki 305-0045, Japan;
Graduate School of Engineering, Department of Materials Science & Technology, Nagoya Institute of Technology, Gokiso-cho, Showa-ku, Nagoya 466-8555, Japan;
Photon Factory, Institute of Materials Structure Science, High Energy Accelerator Research Organization, 1-1 Oho, Tsukuba, Ibaraki 305-0801, Japan;
机译:定量X射线反射率分析和GISAXS法测定介孔二氧化硅薄膜的孔隙率
机译:使用GISAXS和X射线反射率确定表面活性剂模板二氧化硅薄膜的壁厚和芯半径
机译:使用三维3D掠入射小角度X射线散射(GISAXS)分析探测中孔二氧化硅膜中的孔变形
机译:在光子厂的BL-15A2处的柔软X射线衍射仪的进一步发展
机译:相对X射线谱线强度及其在单个标准程序中的应用,用于对大体积样品和薄膜进行定量X射线微分析。
机译:通过放牧入射率小角X射线散射(吉安斯)技术用170keV质子照射聚醚醚酮膜的微观结构研究
机译:利用柔软的X射线,吉伊斯检查表面附近的薄膜纳米结构